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John O’Connell Featured in 2025 InvestmentNews Hot List of Top Financial Professionals in the US
John O'Connell, founder and CEO of The Oasis Group, has been featured... read more
John O’Connell Interviewed by WealthManagement.com at the 2025 Advyzon Conference: 2025 WealthTech Trends: AI, Cybersecurity, and the Future of Advisor Tech
John O’Connell discusses key trends shaping the industry with WealthManagement.com at the... read more
John O’Connell Published in Advisor Perspectives by VettaFi: Start Your Year with A Technology Assessment
The Oasis Group CEO John O’Connell wrote this bylined article that was... read more
John O’Connell Interviewed on T3 Social Cam at the 2026 T3 Technology Conference: AI University and AI Prompt Engineering
John O’Connell was interviewed on the T3 Social Cam at the 2026... read more
John O’Connell Featured in WealthManagement.com: Fireflies.ai Throws Down the AI Notetaking Gauntlet
John O'Connell was quoted in this article from WealthManagement.com that discusses the... read more
John O’Connell Published in Advisorpedia: Smarter Prompts, Better Advice: How Wealth Managers Can Use Prompt Engineering To Get More From AI
John O'Connell discusses how wealth managers can use prompt engineering to get... read more
John O’Connell Featured in RIABiz: Schwab’s new $5-per-RIA-client trading fees set to activate Tuesday
John O’Connell was featured in this RIABiz article discussing Schwab's new $5-per-RIA-client... read more
John O’Connell Featured in Advisorpedia: The Advisor Shortage Is a Design Problem. Treat It Like One.
John O'Connell was recently featured in Advisorpedia arguing that firms misdiagnose... read more
John O’Connell Featured in Financial Planning Magazine: What advisors should prioritize when evaluating tech purchases
John O'Connell was featured in this Financial Planning Magazine article covering a... read more
John O’Connell Quoted in Family Wealth Report on Envestnet Possibly Restructuring After Bain Purchase
The Oasis Group CEO John O’Connell was quoted in this article in... read more